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Narayan Vyas, an academician at Vivekananda Global University, specializes in computer science, focusing on IoT and Mobile App Development. He has trained over 1000 students globally and published extensively in Scopus journals. An active IEEE member, his research interests include Remote Sensing, Machine Learning, and Computer Vision.

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Editors:U. K. Lilhore, A. Anand, A. Kumar, S. P. Yadav, and N. Vyas, Eds.
08/2024
| Book
| IGI Global
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Editors:P. Raj, H. H. Song, D.-N. Le, and N. Vyas, Eds.
07/2024
| Book
| De Gruyter
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Editors:U. K. Lilhore, A. Kumar, S. Simaiya, N. Vyas, and V. Dutt, Eds.
04/2024
| Book
| IGI Global
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Authors:N. Bhati and N. Vyas
03/2024
| Book Chapter
| IGI Global
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Editors:V. Dutt, A. Kumar, S. Ahuja, A. Baliyan, and N. Vyas, Eds.
12/2023
| Book
| IGI Global
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Editors:A. Kumar, A. L. Srivastav, A. K. Dubey, V. Dutt, and N. Vyas, Eds.
11/2023
| Book
| IGI Global
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Authors:N. Vyas, N. N. Jadhav, V. V. Raje and C. Choudhary
11/2023
| Conference
| IEEE
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Authors:Mamta, M. B. Mane, N. Vyas and A. Baliyan
11/2023
| Conference
| IEEE
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Authors:C. Choudhary, N. Vyas and U. Kumar Lilhore
11/2023
| Conference
| IEEE
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Authors:Anurag, N. Vyas and U. Kumar Lilhore
11/2023
| Conference
| IEEE
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Authors:V. R. Burugadda, V. Dutt, Mamta and N. Vyas
10/2023
| Conference
| IEEE
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Authors:H. Prasad, A. Singh, J. Thakur, C. Choudhary and N. Vyas
09/2023
| Conference
| IEEE
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Authors:Akanksha, K. Ranjan and N. Vyas
09/2023
| Conference
| IEEE
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Authors:V. R. Burugadda, V. C. Patil, N. Vyas and A. Pokhriyal
09/2023
| Conference
| IEEE
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Authors:S. R. Burri, D. K. Agarwal, N. Vyas and R. Duggar
09/2023
| Conference
| IEEE
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Authors:Anurag, N. Vyas, V. Sharma and D. Balla
09/2023
| Conference
| IEEE
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Authors:V. R. Burugadda, N. Jadhav, N. Vyas and R. Duggar
08/2023
| Conference
| IEEE
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Authors:S. Chandrasekaran, V. Dutt, N. Vyas and A. Anand
02/2023
| Conference
| IEEE
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Authors:S. Chandrasekaran, R. Agrawal, V. Dutt, and N. Vyas
01/2023
| Conference
| IEEE
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Authors:S. Chandrasekaran, V. Dutt, N. Vyas, and R. Kumar
01/2023
| Conference
| IEEE
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Authors:S. Boyapati, S. R. Swarna, V. Dutt, and N. Vyas
12/2020
| Conference
| IEEE

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